Beilstein J. Nanotechnol.2017,8, 2357–2362, doi:10.3762/bjnano.8.235
visible spectrum through a fit of the acquired spectra to a model based on the Fresnel law.
Keywords: complex refractive index; franckeite; optical contrast; opticalidentification; van der Waals heterostructure; Introduction
Mechanical exfoliation is a very powerful technique to produce a large variety
Gelpak®) carrier substrate and then transferred to a SiO2/Si substrate by means of an all-dry transfer technique [24]. We employed two different nominal SiO2 thicknesses (ca. 90 and ca. 290 nm) to probe the role of the SiO2 thickness on the opticalidentification process. We selected those thickness
available in the literature yet and it results crucial to further analysis of the optical properties of a material. For example, knowing the refractive index of a 2D material allows one to determine the substrate that optimizes its opticalidentification. This is done by calculating the optical contrast of
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Figure 1:
Crystal structure of franckeite where the two different stacked layers, the SnS2-like and the PbS-l...
Beilstein J. Nanotechnol.2012,3, 230–237, doi:10.3762/bjnano.3.26
/6z2).
SiO2 resolution controversy
Graphene was brought to prominence by the pioneering work of Geim and Novoselov in developing a fabrication technique for graphene devices involving opticalidentification of exfoliated flakes on 300 nm thick SiO2/Si [8]. As a result, much of the early scanning probe
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Figure 1:
AFM resolution examples: (a) high resolution UHV NC-AFM image of SiO2 displaying features with radi...